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Multipurpose memory test system features compact, reduced-footprint design Advantest Announces Debut of Model T5377S Memory Test System Advantest (Europe) GmbH, the global leader in semiconductor test systems, today introduced its T5377S multipurpose memory test system for wafer testing of DRAM devices, and both package and wafer testing of flash memories. To maximize limited production space, the system employs a new, compact design that utilizes half the footprint of the company’s Model T5377, yet is completely compatible with both the T5375 and T5377 (currently used by most major DRAM manufacturers). Capable of testing up to 128 devices simultaneously at maximum test speeds of 143MHz/288Mbps, Advantest’s T5377S is a cost-effective, high-throughput test solution specifically designed to provide the flexibility required for testing today’s advanced memory devices. In 2003, the Semiconductor Industry Association (SIA) calculated the flash-memory market to be $11.7 billion, estimating a 49-percent increase in 2004, to reach $17.5 billion. Driving this upswing is the demand for portable electronic devices requiring flash memory chips, such as wireless phones, PDAs and notebook PCs with wireless functionality. This robust growth has challenged production lines to keep pace by manufacturing larger quantities and a broader mix of memory chips, complex multi-die stacked devices, and reducing turnaround times to satisfy consumer markets. Meanwhile, the price of large-capacity, high-speed DRAMs and DDR SDRAMs has fluctuated wildly. As a result, competitive memory manufacturers must be able to respond quickly to changing market demands. This requires cost-effective, flexible test solutions that enable manufacturers to easily adjust production systems to accommodate various memory devices. T5377S Features The T5377S shares many of the same capabilities as its predecessor system, in a 50-percent smaller mainframe footprint. Able to test up to 128 devices simultaneously at 10 I/Os per device, the system supports functional testing and redundancy analysis for high-density memory devices, and employs high-voltage and high-current driver solutions on a per-pin basis. Additionally, the T5377S can capture fail data with up to four times larger capture capacity than previous systems. Compared to the T5377, transfer times for wafer-fail bitmap on individual chips are enhanced tenfold via a newly implemented compression and transfer scheme. The DC resources are also doubled from 64 to 128, leading to a 10-percent improvement in throughput for parametric test. About Advantest Advantest Corporation is one of the world’s leading automatic test equipment suppliers to the semiconductor industry, and is also a producer of electronic and optoelectronic instruments and systems. A global company, Advantest has long offered total ATE solutions, and serves the industry in every component of semiconductor test: tester, handler, mechanical and electrical interfaces, and software. Its logic, memory, mixed-signal and RF testers as well as device handlers are integrated into the most advanced semiconductor fabrication lines in the world. In 1984 the company was listed on the Tokyo stock exchange and in 2001 on the New York stock exchange. More information is available at www.advantest.de. Kontaktinformationen: Advantest (Europe) GmbH Head Office, Munich: Stefan-George-Ring 2 81929 München T: +49/89/99312-0 F: +49/89/99312-101 info@advantest.de news@advantest.de
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